Solutions
テスト自動化ソリューション
電子機器製造の試験効率、データトレーサビリティ、治具信頼性、生産タクトに対応するソリューションを紹介します。詳細な技術情報は英語ページでご覧いただけます。
業界別ソリューション
まず用途シーンを選び、DUTと試験工程に合ったソリューションをご確認ください。Automotive & EV Test Solutions
BMS、CVS、CCU、OBC、TCM/TCU、V2X向けのFCT、EOL、Burn-In、CAN/LIN通信、高電圧・大電流試験、生産自動化をカバーします。
ソリューション一覧
以下の詳細ページは現在英語で提供しています。製品・試験工程に対応する技術情報をご確認ください。800G Optical Module Automated Test System
An automated test system for 400G/800G high-speed optical module production testing, covering instrument control, fixture integration, parameter acquisition, result judgment, reporting and traceability.
English fallback · 詳細を見る English fallback · RF & Wireless TestRF & Wireless Automated Test Solutions
Automated RF and wireless test solutions for Wi-Fi, Bluetooth, NB-IoT, RFID and RF-enabled products, covering RF measurement, path calibration, programming, functional validation and production test.
English fallback · 詳細を見る English fallback · Machine Vision TestMachine Vision Test & Inspection Solutions
Integrated machine vision test and inspection solutions for electronics manufacturing, including LED, display, appearance, dimension and position inspection combined with functional test and production automation.
English fallback · 詳細を見る English fallback · Power Electronics TestPower Electronics Automated Test Solutions
Automated test engineering solutions for AC/DC converters, DC/DC converters, SMPS, power modules and automotive power electronics, covering electrical performance, dynamic load, protection, isolation, burn-in and system integration.
English fallback · 詳細を見る English fallback · New Energy Vehicle Test SolutionNew Energy Vehicle BMS Automated Test Solution
An automated test solution for new energy vehicle BMS validation and production testing, covering high-voltage testing, CAN/LIN communication, functional testing, data acquisition, result judgment and traceability.
English fallback · 詳細を見る English fallback · Semiconductor and PCB Test SolutionJTAG Boundary Scan Test Solution
A high-coverage PCB test solution based on Boundary Scan technology, covering JTAG, IEEE 1149.x, BGA, FPGA, DDR, Flash and ICT/FCT integrated testing scenarios.
English fallback · 詳細を見る English fallback · Automated Programming and Firmware Management SolutionSmart Automated Programming and Firmware Management Solution
An automated programming, firmware management and production traceability solution for automotive electronics, semiconductor and smart hardware manufacturers, covering MCU, EEPROM, Flash, ECU, BMS, VBF processing, HEX/S19 conversion, automatic verification and MES integration.
English fallback · 詳細を見る English fallback · Test Interface and Mass Interconnect SolutionMass Interconnect Test System Solution
A standardized, modular and highly reliable signal interconnect solution for complex automated test systems, supporting UUT-to-Test Resource architecture, PXI test systems, fixtures, quick changeover and localized alternatives.
English fallback · 詳細を見る English fallback · AI Server and Liquid Cooling Test SolutionAI Server Motherboard and Liquid Cooling Automated Test Solution
An automated test solution for AI server, high-performance computing equipment and liquid cooling system manufacturers, covering AI server motherboard testing, GPU server testing, high-speed interfaces, power, power consumption, liquid cooling inspection, leakage, thermal control, burn-in testing and traceability.
English fallback · 詳細を見る